• DocumentCode
    1189004
  • Title

    Langmuir probes in switching vacuum arc measurements

  • Author

    Klajn, Antoni

  • Author_Institution
    Inst. of Electr. Power Eng., Wroclaw Univ. of Technol., Poland
  • Volume
    33
  • Issue
    5
  • fYear
    2005
  • Firstpage
    1611
  • Lastpage
    1617
  • Abstract
    Some properties of the Langmuir probes used in measurements of electron parameters in a vacuum switching arc were tested experimentally and are reported in the paper. Two shapes of the probe, plane and Faraday-cup one, placed at various distances from the arc column, were compared. Also, some shields of probes were tested. Probes were supplied with a sawtooth potential, as well as with a constant one. The arc current was a sine half-wave generated in an oscillatory low-voltage circuit, with amplitudes set from 400 A up to 1400 A with frequency of about 30 Hz. These parameters are representative for a low-voltage vacuum switching arc. The arc frequency, lower than the frequency in power network, was chosen in order to simulate both the alternating current, as well as a short duration direct current arc. The electron parameters temperature, thermal velocity, and density, were estimated. The statistical distribution of results and its accuracy was analyzed and discussed in order to observe the relation between various probe shapes, shielding conditions and the probe distance from the arcing contacts. The significant parameters, discussed in the paper, are relations between probe area and the probe distance from the arc and current densities of the probe and that of the arc. Finally, some criteria, which can be useful at application of Langmuir probes to measurements of the low-voltage vacuum arc plasma parameters were proposed.
  • Keywords
    Langmuir probes; plasma density; plasma temperature; plasma transport processes; statistical distributions; vacuum arcs; 30 Hz; 400 to 1400 A; Faraday-cup; Langmuir probes; arc current; arc frequency; current densities; electron density; electron temperature; electron thermal velocity; oscillatory low-voltage circuit; power network; sawtooth potential; sine half-wave; statistical distribution; switching vacuum arc measurements; Circuit simulation; Circuit testing; Electrons; Frequency; Plasma measurements; Potential well; Probes; Shape; Switching circuits; Vacuum arcs; Langmuir probe; plasma parameters; switching vacuum arc;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2005.856485
  • Filename
    1518986