DocumentCode :
1189007
Title :
Multiple signature analysis method using fault simulation
Author :
Sameshima, Yasunori ; Kitamura, Yoshihiro ; Fukazawa, Tomoo
Author_Institution :
NTT LSI Labs., Kanagawa, Japan
Volume :
13
Issue :
11
fYear :
1994
fDate :
11/1/1994 12:00:00 AM
Firstpage :
1434
Lastpage :
1437
Abstract :
This paper presents a signature analysis method that achieves a minimum aliasing rate. A fault stay map derived from exact fault simulation without fault dropping indicates whether a fault remains in an output data compressor at each time step. The fault stay map is used to determine the timing of multiple signature observations to achieve the minimum aliasing rate under certain constraints. Experimental results for some combinational circuits modeled on a single stuck-at fault are presented. They show that only two signature observations are required to achieve 0% aliasing in almost all circuits
Keywords :
automatic testing; built-in self test; combinatorial circuits; logic testing; combinational circuits; fault simulation; fault stay map; minimum aliasing rate; multiple signature analysis method; output data compressor; single stuck-at fault; Analytical models; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Design for testability; Test pattern generators; Timing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.329274
Filename :
329274
Link To Document :
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