DocumentCode
1189007
Title
Multiple signature analysis method using fault simulation
Author
Sameshima, Yasunori ; Kitamura, Yoshihiro ; Fukazawa, Tomoo
Author_Institution
NTT LSI Labs., Kanagawa, Japan
Volume
13
Issue
11
fYear
1994
fDate
11/1/1994 12:00:00 AM
Firstpage
1434
Lastpage
1437
Abstract
This paper presents a signature analysis method that achieves a minimum aliasing rate. A fault stay map derived from exact fault simulation without fault dropping indicates whether a fault remains in an output data compressor at each time step. The fault stay map is used to determine the timing of multiple signature observations to achieve the minimum aliasing rate under certain constraints. Experimental results for some combinational circuits modeled on a single stuck-at fault are presented. They show that only two signature observations are required to achieve 0% aliasing in almost all circuits
Keywords
automatic testing; built-in self test; combinatorial circuits; logic testing; combinational circuits; fault simulation; fault stay map; minimum aliasing rate; multiple signature analysis method; output data compressor; single stuck-at fault; Analytical models; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Design for testability; Test pattern generators; Timing;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.329274
Filename
329274
Link To Document