• DocumentCode
    1189007
  • Title

    Multiple signature analysis method using fault simulation

  • Author

    Sameshima, Yasunori ; Kitamura, Yoshihiro ; Fukazawa, Tomoo

  • Author_Institution
    NTT LSI Labs., Kanagawa, Japan
  • Volume
    13
  • Issue
    11
  • fYear
    1994
  • fDate
    11/1/1994 12:00:00 AM
  • Firstpage
    1434
  • Lastpage
    1437
  • Abstract
    This paper presents a signature analysis method that achieves a minimum aliasing rate. A fault stay map derived from exact fault simulation without fault dropping indicates whether a fault remains in an output data compressor at each time step. The fault stay map is used to determine the timing of multiple signature observations to achieve the minimum aliasing rate under certain constraints. Experimental results for some combinational circuits modeled on a single stuck-at fault are presented. They show that only two signature observations are required to achieve 0% aliasing in almost all circuits
  • Keywords
    automatic testing; built-in self test; combinatorial circuits; logic testing; combinational circuits; fault simulation; fault stay map; minimum aliasing rate; multiple signature analysis method; output data compressor; single stuck-at fault; Analytical models; Automatic testing; Built-in self-test; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Design for testability; Test pattern generators; Timing;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.329274
  • Filename
    329274