• DocumentCode
    118903
  • Title

    Microstructure and properties of Sn2.5Ag0.7Cu0.1RE lead-free soldering joints with ultrasonic assisted

  • Author

    Yu-jie Liu ; Ke-ke Zhang ; Xiao-jiao Zhang ; Kai Zhao ; Ran-feng Qiu ; Hong-xin Shi

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Henan Univ. of Sci. & Technol., Luoyang, China
  • fYear
    2014
  • fDate
    12-15 Aug. 2014
  • Firstpage
    1233
  • Lastpage
    1236
  • Abstract
    Sn2.5Ag0.7Cu0.1RE/Cu solder joints were obtained with ultrasonic vibration assisted. Microstructure and properties of the joints were studied. Experimental results show that reliable soldering of Sn2.5Ag0.7Cu0.1RE/Cu can be achieved under condition of ultrasonic power of 88 W and low-halogen flux. The maximum shear strength of 26.0 MPa is obtained from the joint soldered at ultrasonic vibration time of 60 s, which increased by 35%. Compared with that of the solder joint obtained without external energy assisted, the application of ultrasonic vibration during soldering can decrease thickness and roughness of the interfacial Cu6Sn5 intermetallic compound, and the fracture mechanisms of the solder joints transforms from brittle fracture to mixed fracture, which is dominated as ductile fracture.
  • Keywords
    copper alloys; ductile fracture; reliability; shear strength; silver alloys; soldering; tin alloys; ultrasonic applications; Sn2.5Ag0.7Cu0.1; brittle fracture; ductile fracture; interfacial intermetallic compound roughness; interfacial intermetallic compound thickness; joint microstructure; joint properties; lead-free soldering joints; low-halogen flux; maximum shear strength; mixed fracture; soldering reliability; time 60 s; ultrasonic power condition; ultrasonic vibration assisted; ultrasonic vibration time; Three-dimensional displays; Lead-free solder joint; Microstructure; Property; Ultrasonic wave;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
  • Conference_Location
    Chengdu
  • Type

    conf

  • DOI
    10.1109/ICEPT.2014.6922866
  • Filename
    6922866