DocumentCode
118903
Title
Microstructure and properties of Sn2.5Ag0.7Cu0.1RE lead-free soldering joints with ultrasonic assisted
Author
Yu-jie Liu ; Ke-ke Zhang ; Xiao-jiao Zhang ; Kai Zhao ; Ran-feng Qiu ; Hong-xin Shi
Author_Institution
Sch. of Mater. Sci. & Eng., Henan Univ. of Sci. & Technol., Luoyang, China
fYear
2014
fDate
12-15 Aug. 2014
Firstpage
1233
Lastpage
1236
Abstract
Sn2.5Ag0.7Cu0.1RE/Cu solder joints were obtained with ultrasonic vibration assisted. Microstructure and properties of the joints were studied. Experimental results show that reliable soldering of Sn2.5Ag0.7Cu0.1RE/Cu can be achieved under condition of ultrasonic power of 88 W and low-halogen flux. The maximum shear strength of 26.0 MPa is obtained from the joint soldered at ultrasonic vibration time of 60 s, which increased by 35%. Compared with that of the solder joint obtained without external energy assisted, the application of ultrasonic vibration during soldering can decrease thickness and roughness of the interfacial Cu6Sn5 intermetallic compound, and the fracture mechanisms of the solder joints transforms from brittle fracture to mixed fracture, which is dominated as ductile fracture.
Keywords
copper alloys; ductile fracture; reliability; shear strength; silver alloys; soldering; tin alloys; ultrasonic applications; Sn2.5Ag0.7Cu0.1; brittle fracture; ductile fracture; interfacial intermetallic compound roughness; interfacial intermetallic compound thickness; joint microstructure; joint properties; lead-free soldering joints; low-halogen flux; maximum shear strength; mixed fracture; soldering reliability; time 60 s; ultrasonic power condition; ultrasonic vibration assisted; ultrasonic vibration time; Three-dimensional displays; Lead-free solder joint; Microstructure; Property; Ultrasonic wave;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location
Chengdu
Type
conf
DOI
10.1109/ICEPT.2014.6922866
Filename
6922866
Link To Document