DocumentCode :
1189078
Title :
Node-fault diagnosis and a design of testability
Author :
Huang, Zheng F. ; Lin, Chen-Shang ; Liu, Ruey-Wen
Volume :
30
Issue :
5
fYear :
1983
fDate :
5/1/1983 12:00:00 AM
Firstpage :
257
Lastpage :
265
Abstract :
A concept of 
-node-fault testability is introduced. A sufficient and almost necessary condition for testability as well as the test procedure is presented. This condition is further evolved to a necessary and almost sufficient topological condition for testability. A unique feature of this condition is that it depends only on the graph of the circuit, not on the element values. Based on this condition, a design of testability can be established.
-node-fault testability is introduced. A sufficient and almost necessary condition for testability as well as the test procedure is presented. This condition is further evolved to a necessary and almost sufficient topological condition for testability. A unique feature of this condition is that it depends only on the graph of the circuit, not on the element values. Based on this condition, a design of testability can be established.Keywords :
Analog system fault diagnosis; Large scale networks and power systems; Circuit faults; Circuit testing; Equations; Fault detection; Fault diagnosis; Fault location; Impedance; Symmetric matrices; Transfer functions; Voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-4094
Type :
jour
DOI :
10.1109/TCS.1983.1085359
Filename :
1085359
Link To Document :
