fDate :
3/1/1962 12:00:00 AM
Abstract :
Contains an entry for each author and coauthor included in this issue of the publication.
Keywords :
Atmospheric modeling; Integrated circuit reliability; Laboratories; Modeling; Psychology; Reliability; Reliability engineering; arsenic; astatine; fluorine; indium; iodine; mass; nitrogen;
Journal_Title :
Human Factors in Electronics, IRE Transactions on
DOI :
10.1109/THFE2.1962.4503333
