Title :
Automatic Verification Stimulus Generation for Interface Protocols Modeled With Non-Deterministic Extended FSM
Author :
Shih, Che-Hua ; Huang, Juinn-Dar ; Jou, Jing-Yang
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu
fDate :
5/1/2009 12:00:00 AM
Abstract :
Verifying if an integrated component is compliant with certain interface protocol is a vital issue in component-based system-on-a-chip (SoC) designs. For simulation-based verification, generating massive constrained simulation stimuli is becoming crucial to achieve a high verification quality. To further improve the quality, stimulus biasing techniques are often used to guide the simulation to hit design corners. In this paper, we model the interface protocol with the non-deterministic extended finite-state machine (NEFSM), and then propose an automatic stimulus generation approach based on it. This approach is capable of providing numerous biasing strategies. Experiment results demonstrate the high controllability and efficiency of our stimulus generation scheme.
Keywords :
circuit simulation; finite state machines; system-on-chip; SoC; automatic verification stimulus generation; component-based system-on-a-chip designs; finite-state machine; interface protocols; massive constrained simulation stimuli; nondeterministic extended FSM; simulation-based verification; stimulus biasing techniques; Design automation; generators;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2008.2006042