Title :
Dynamic testing of Xilinx Virtex-II field programmable gate array (FPGA) input/output blocks (IOBs)
Author :
Swift, Gary M. ; Rezgui, Sana ; George, Jeffrey ; Carmichael, Carl ; Napier, Matthew ; Maksymowicz, John ; Moore, Jason ; Lesea, Austin ; Koga, R. ; Wrobel, T.F.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Abstract :
Heavy-ion irradiation and fault injection experiments were conducted to evaluate the upset sensitivity of the Xilinx Virtex-II field programmable gate arrays (FPGAs) input/output block (IOB). Full triple module redundancy (TMR) of the IOBs, in combination with regular configuration scrubbing, proved to be a quite effective upset mitigation method.
Keywords :
dynamic testing; field programmable gate arrays; ion beam effects; redundancy; FPGA input/output blocks; Xilinx Virtex-II field programmable gate array; dynamic testing; effective upset mitigation method; fault injection experiments; heavy-ion irradiation; radiation effects; reconfigurable field programmable gate arrays; regular configuration scrubbing; single-event effects; triple module redundancy; upset sensitivity; Aerodynamics; Field programmable gate arrays; Laboratories; NASA; Propulsion; Radiation effects; Redundancy; Single event transient; Software tools; Testing;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.839190
