Investigation of millisecond-long analog single-event transients in the LM6144 op amp

A new category of analog single-event transients (SETs) with millisecond-long durations have been experimentally observed in the LM6144 operational amplifier. It is the first time that events with such extreme widths are under investigation in a linear integrated circuit. Relying on heavy-ion broadbeam tests, picosecond pulsed lasers diagnostics, and computer-assisted circuit modeling, we uncover the mechanisms and causes of these anomalous voltage transients. The identification of the problematic area of the IC reveals that the bias/startup circuitry is sensitive to energetic ionizing particles and can be responsible for corrupted circuit operations when subjected to a heavy-ion strike. A circuit hardening solution with minimal impact on the layout and the electrical performances of the op amp are proposed to mitigate this effect.