• DocumentCode
    1189339
  • Title

    Frequency-domain analysis of analog single-event transients (ASETs) based on energy spectral density

  • Author

    Kauppila, Amy V. ; Massengill, Lloyd W. ; Holman, William T. ; Vaughn, Gregg L. ; Kauppila, Jeffrey S.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
  • Volume
    51
  • Issue
    6
  • fYear
    2004
  • Firstpage
    3537
  • Lastpage
    3545
  • Abstract
    We present an analysis of analog single-event transients (ASETs) in the frequency domain. Through an overall error energy defined here, a metric of part susceptibility and the impact on surrounding system components can be determined.
  • Keywords
    Fourier transforms; analogue processing circuits; frequency-domain analysis; operational amplifiers; radiation effects; signal processing; transient analysis; Fourier transforms; analog single-event transients; energy spectral density; frequency-domain analysis; operational amplifier; radiation effects; signal processing theory; surrounding system; susceptibility; Circuit simulation; Circuit testing; Computer errors; Energy measurement; Fourier transforms; Frequency domain analysis; Operational amplifiers; Pulse measurements; Space vector pulse width modulation; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.839108
  • Filename
    1369522
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1189339