Title :
Frequency-domain analysis of analog single-event transients (ASETs) based on energy spectral density
Author :
Kauppila, Amy V. ; Massengill, Lloyd W. ; Holman, William T. ; Vaughn, Gregg L. ; Kauppila, Jeffrey S.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Abstract :
We present an analysis of analog single-event transients (ASETs) in the frequency domain. Through an overall error energy defined here, a metric of part susceptibility and the impact on surrounding system components can be determined.
Keywords :
Fourier transforms; analogue processing circuits; frequency-domain analysis; operational amplifiers; radiation effects; signal processing; transient analysis; Fourier transforms; analog single-event transients; energy spectral density; frequency-domain analysis; operational amplifier; radiation effects; signal processing theory; surrounding system; susceptibility; Circuit simulation; Circuit testing; Computer errors; Energy measurement; Fourier transforms; Frequency domain analysis; Operational amplifiers; Pulse measurements; Space vector pulse width modulation; Transient analysis;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.839108
