Title :
A comprehensive analog single-event transient analysis methodology
Author :
Savage, MarkW ; Titus, Jeffery L. ; Turflinger, Thomas L. ; Pease, Ronald L. ; Poivey, Christian
Author_Institution :
NAVSEA Crane, IN, USA
Abstract :
A new method for analyzing analog single-event transient (ASET) data has been developed. The approach allows for quantitative error calculations, given device failure thresholds. The method is described and employed in the analysis of an OP-27 op-amp.
Keywords :
error analysis; ion beam effects; operational amplifiers; transient analysis; OP-27 operational amplifier; analog single-event transient analysis methodology; device failure thresholds; heavy ions; quantitative error calculations; Circuit testing; Cranes; Digital relays; Energy exchange; FETs; Operational amplifiers; Oscilloscopes; Pulse measurements; Transient analysis; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.839107
