Title :
Demonstration of single-event effects induced by through-wafer two-photon absorption
Author :
McMorrow, Dale ; Buchner, Stephen ; Lotshaw, William T. ; Melinger, Joseph S. ; Maher, Mike ; Savage, Mark W.
Author_Institution :
Naval Res. Lab., Washington, DC, USA
Abstract :
The first demonstration of through-wafer two-photon absorption (TPA) single-event effects (SEEs) testing is presented. We interrogate the single-event transient (SET) response of several different nodes of the LM124 operational amplifier via TPA carrier injection through both the front and back (substrate) chip surfaces. The results reveal that the SETs and sensitivities produced in several different nodes by front-side and back-side irradiation are effectively identical, confirming the validity of this approach for SEE studies.
Keywords :
gamma-ray effects; operational amplifiers; transient response; two-photon processes; LM124 operational amplifier; SEE; irradiation effect; multiphoton absorption; nonlinear absorption; nonlinear-optical carrier injection; single-event effect testing; single-event transient; substrate chip surfaces; through-wafer two-photon absorption; Absorption; Nonlinear optics; Operational amplifiers; Optical amplifiers; Optical materials; Optical pulse generation; Pulse amplifiers; Semiconductor lasers; Semiconductor materials; Ultrafast optics;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.839106
