Demonstration of single-event effects induced by through-wafer two-photon absorption

Author

McMorrow, Dale ; Buchner, Stephen ; Lotshaw, William T. ; Melinger, Joseph S. ; Maher, Mike ; Savage, Mark W.

Author_Institution

Naval Res. Lab., Washington, DC, USA

Volume

51

Issue

6

fYear

2004

Firstpage

3553

Lastpage

3557

Abstract

The first demonstration of through-wafer two-photon absorption (TPA) single-event effects (SEEs) testing is presented. We interrogate the single-event transient (SET) response of several different nodes of the LM124 operational amplifier via TPA carrier injection through both the front and back (substrate) chip surfaces. The results reveal that the SETs and sensitivities produced in several different nodes by front-side and back-side irradiation are effectively identical, confirming the validity of this approach for SEE studies.

Keywords

gamma-ray effects; operational amplifiers; transient response; two-photon processes; LM124 operational amplifier; SEE; irradiation effect; multiphoton absorption; nonlinear absorption; nonlinear-optical carrier injection; single-event effect testing; single-event transient; substrate chip surfaces; through-wafer two-photon absorption; Absorption; Nonlinear optics; Operational amplifiers; Optical amplifiers; Optical materials; Optical pulse generation; Pulse amplifiers; Semiconductor lasers; Semiconductor materials; Ultrafast optics;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2004.839106

Filename

1369524