Title :
Measuring Volterra kernels
Author :
Boyd, Stephen ; Tang, Y.S. ; Chua, Leon O.
fDate :
8/1/1983 12:00:00 AM
Abstract :
Volterra series have been in the engineering literature for some time now, and yet there have been few attempts to measure Volterra kernels. This paper discusses techniques for measuring the Volterra kernels of weakly nonlinear systems. We introduce a new quick method for measuring the second Volterra kernel which is analogous to pseudonoise testing of a linear device. To illustrate the discussion we present an experimental example, an electro-acoustic transducer. Throughout the paper we emphasize the practical aspects of kernel measurement.
Keywords :
Nonlinear modeling; Nonlinear systems; Volterra series; Distortion measurement; Frequency measurement; Kernel; Noise measurement; Nonlinear distortion; Nonlinear systems; Predictive models; Time domain analysis; Transducers; White noise;
Journal_Title :
Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCS.1983.1085391