DocumentCode
1189374
Title
Measuring Volterra kernels
Author
Boyd, Stephen ; Tang, Y.S. ; Chua, Leon O.
Volume
30
Issue
8
fYear
1983
fDate
8/1/1983 12:00:00 AM
Firstpage
571
Lastpage
577
Abstract
Volterra series have been in the engineering literature for some time now, and yet there have been few attempts to measure Volterra kernels. This paper discusses techniques for measuring the Volterra kernels of weakly nonlinear systems. We introduce a new quick method for measuring the second Volterra kernel which is analogous to pseudonoise testing of a linear device. To illustrate the discussion we present an experimental example, an electro-acoustic transducer. Throughout the paper we emphasize the practical aspects of kernel measurement.
Keywords
Nonlinear modeling; Nonlinear systems; Volterra series; Distortion measurement; Frequency measurement; Kernel; Noise measurement; Nonlinear distortion; Nonlinear systems; Predictive models; Time domain analysis; Transducers; White noise;
fLanguage
English
Journal_Title
Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0098-4094
Type
jour
DOI
10.1109/TCS.1983.1085391
Filename
1085391
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