• DocumentCode
    1189374
  • Title

    Measuring Volterra kernels

  • Author

    Boyd, Stephen ; Tang, Y.S. ; Chua, Leon O.

  • Volume
    30
  • Issue
    8
  • fYear
    1983
  • fDate
    8/1/1983 12:00:00 AM
  • Firstpage
    571
  • Lastpage
    577
  • Abstract
    Volterra series have been in the engineering literature for some time now, and yet there have been few attempts to measure Volterra kernels. This paper discusses techniques for measuring the Volterra kernels of weakly nonlinear systems. We introduce a new quick method for measuring the second Volterra kernel which is analogous to pseudonoise testing of a linear device. To illustrate the discussion we present an experimental example, an electro-acoustic transducer. Throughout the paper we emphasize the practical aspects of kernel measurement.
  • Keywords
    Nonlinear modeling; Nonlinear systems; Volterra series; Distortion measurement; Frequency measurement; Kernel; Noise measurement; Nonlinear distortion; Nonlinear systems; Predictive models; Time domain analysis; Transducers; White noise;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-4094
  • Type

    jour

  • DOI
    10.1109/TCS.1983.1085391
  • Filename
    1085391