• DocumentCode
    1189435
  • Title

    Single event Simulation methodology for analog/mixed signal design hardening

  • Author

    Kauppila, Jeffery S. ; Massengill, Lloyd W. ; Holman, W. Tim ; Kauppila, Amy V. ; Sanathanamurthy, S.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
  • Volume
    51
  • Issue
    6
  • fYear
    2004
  • Firstpage
    3603
  • Lastpage
    3608
  • Abstract
    We propose a single-event simulation methodology to characterize the upset/error window of vulnerability for analog/mixed signal circuits. A custom designed 8-b pipeline analog-to-digital converter (ADC) is characterized and hardened based on the results of the simulations.
  • Keywords
    analogue-digital conversion; circuit simulation; mixed analogue-digital integrated circuits; radiation hardening (electronics); 8-b pipeline analog-to-digital converter; ADC; analog signal design hardening; analog-mixed signal circuits; circuit simulation; mixed signal design hardening; single event simulation methodology; upset-error window; vulnerability; Analog-digital conversion; Analytical models; Circuit noise; Circuit simulation; Discrete event simulation; Performance analysis; Pipelines; Signal design; Single event upset; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2004.839162
  • Filename
    1369531
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1189435