Title :
Single event Simulation methodology for analog/mixed signal design hardening
Author :
Kauppila, Jeffery S. ; Massengill, Lloyd W. ; Holman, W. Tim ; Kauppila, Amy V. ; Sanathanamurthy, S.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Vanderbilt Univ., Nashville, TN, USA
Abstract :
We propose a single-event simulation methodology to characterize the upset/error window of vulnerability for analog/mixed signal circuits. A custom designed 8-b pipeline analog-to-digital converter (ADC) is characterized and hardened based on the results of the simulations.
Keywords :
analogue-digital conversion; circuit simulation; mixed analogue-digital integrated circuits; radiation hardening (electronics); 8-b pipeline analog-to-digital converter; ADC; analog signal design hardening; analog-mixed signal circuits; circuit simulation; mixed signal design hardening; single event simulation methodology; upset-error window; vulnerability; Analog-digital conversion; Analytical models; Circuit noise; Circuit simulation; Discrete event simulation; Performance analysis; Pipelines; Signal design; Single event upset; Transient analysis;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.839162
