• DocumentCode
    1189451
  • Title

    Spatially Resolved Characterization of the Coherence Area in the Incoherent Emission Regime of a Broad-Area Vertical-Cavity Surface-Emitting Laser

  • Author

    Verschaffelt, Guy ; Craggs, Gordon ; Peeters, Michael L F ; Mandre, Shyam K. ; Thienpont, Hugo ; Fischer, Ingo

  • Author_Institution
    Dept. of Appl. Phys. & Photonics, Vrije Univ. Brussel, Brussels
  • Volume
    45
  • Issue
    3
  • fYear
    2009
  • fDate
    3/1/2009 12:00:00 AM
  • Firstpage
    249
  • Lastpage
    255
  • Abstract
    We present direct measurements of the spatial coherence area of a pulsed broad-area vertical-cavity surface-emitting laser using a reversing wavefront interferometer. With this technique, we can assess the size and uniformity of the coherence area across the laser aperture, being of importance for projection applications. We show that the output beam can be considered quasi-homogeneous and that the measured coherence area corresponds well with the coherence area deduced from the far-field emission profile. We demonstrate that the coherence area is limited in size by the radial temperature gradient in the device and discuss the origin of coherence variations.
  • Keywords
    light coherence; light interferometers; optical projectors; surface emitting lasers; broad-area vertical-cavity surface-emitting laser; coherence area; incoherent emission regime; laser aperture; reversing wavefront interferometer; spatially resolved characterization; Apertures; Area measurement; Laser beams; Optical pulses; Pulse measurements; Spatial coherence; Spatial resolution; Surface emitting lasers; Surface waves; Vertical cavity surface emitting lasers; Semiconductor laser; spatial coherence; vertical-cavity surface-emitting laser (VCSEL);
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2009.2013085
  • Filename
    4799251