DocumentCode :
1189451
Title :
Spatially Resolved Characterization of the Coherence Area in the Incoherent Emission Regime of a Broad-Area Vertical-Cavity Surface-Emitting Laser
Author :
Verschaffelt, Guy ; Craggs, Gordon ; Peeters, Michael L F ; Mandre, Shyam K. ; Thienpont, Hugo ; Fischer, Ingo
Author_Institution :
Dept. of Appl. Phys. & Photonics, Vrije Univ. Brussel, Brussels
Volume :
45
Issue :
3
fYear :
2009
fDate :
3/1/2009 12:00:00 AM
Firstpage :
249
Lastpage :
255
Abstract :
We present direct measurements of the spatial coherence area of a pulsed broad-area vertical-cavity surface-emitting laser using a reversing wavefront interferometer. With this technique, we can assess the size and uniformity of the coherence area across the laser aperture, being of importance for projection applications. We show that the output beam can be considered quasi-homogeneous and that the measured coherence area corresponds well with the coherence area deduced from the far-field emission profile. We demonstrate that the coherence area is limited in size by the radial temperature gradient in the device and discuss the origin of coherence variations.
Keywords :
light coherence; light interferometers; optical projectors; surface emitting lasers; broad-area vertical-cavity surface-emitting laser; coherence area; incoherent emission regime; laser aperture; reversing wavefront interferometer; spatially resolved characterization; Apertures; Area measurement; Laser beams; Optical pulses; Pulse measurements; Spatial coherence; Spatial resolution; Surface emitting lasers; Surface waves; Vertical cavity surface emitting lasers; Semiconductor laser; spatial coherence; vertical-cavity surface-emitting laser (VCSEL);
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2009.2013085
Filename :
4799251
Link To Document :
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