Title :
High Detectivity Mechanism of ZnO-Based Nanorod Ultraviolet Photodetectors
Author :
Chia-Hsun Chen ; Ching-Ting Lee
Author_Institution :
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
ZnO nanorod arrays are grown on Mg-doped GaN layer using the vapor cooling condensation system. To suppress the surface states and the dangling bonds residing on the sidewall surface of the ZnO nanorods, photoelectrochemical (PEC) surface passivation is carried out on the ZnO nanorods. The peak photoresponsivity of the unpassivated and the passivated ZnO nanorod photodetectors operating at -5 V was 3.0 × 103 A/W and 4.6 × 102 A/W, respectively. The PEC treatment dramatically reduces the noise equivalent power level and increased the specific detectivity up to a value of 1.43 × 1015 cmHz1/2W-1 Moreover, the noise power density spectra of the ZnO nanorod array photodetectors changed from the dependence of 1/f2 to 1/f. These results demonstrate that the generation-recombination centers are successfully passivated by the PEC oxidation method.
Keywords :
1/f noise; II-VI semiconductors; condensation; dangling bonds; gallium compounds; magnesium; nanofabrication; nanorods; oxidation; passivation; photodetectors; photoelectrochemistry; semiconductor growth; surface states; ultraviolet detectors; wide band gap semiconductors; zinc compounds; 1/f2 noise; PEC oxidation method; PEC treatment; ZnO-GaN:Mg; ZnO-based nanorod ultraviolet photodetectors; dangling bonds; generation-recombination centers; high detectivity mechanism; nanorod array photodetectors; noise equivalent power level; noise power density spectra; photoelectrochemical surface passivation; photoresponsivity; surface states; unpassivated nanorod photodetectors; vapor cooling condensation system; voltage -5 V; Density measurement; Light emitting diodes; Nanobioscience; Noise; Photodetectors; Surface treatment; Zinc oxide; Efficiency-gain product; ZnO nanorods; low frequency noise; photoelectrochemical oxidation method; photoresponsivity; specific detectivity;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2013.2238624