DocumentCode
11895
Title
High Detectivity Mechanism of ZnO-Based Nanorod Ultraviolet Photodetectors
Author
Chia-Hsun Chen ; Ching-Ting Lee
Author_Institution
Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
Volume
25
Issue
4
fYear
2013
fDate
Feb.15, 2013
Firstpage
348
Lastpage
351
Abstract
ZnO nanorod arrays are grown on Mg-doped GaN layer using the vapor cooling condensation system. To suppress the surface states and the dangling bonds residing on the sidewall surface of the ZnO nanorods, photoelectrochemical (PEC) surface passivation is carried out on the ZnO nanorods. The peak photoresponsivity of the unpassivated and the passivated ZnO nanorod photodetectors operating at -5 V was 3.0 × 103 A/W and 4.6 × 102 A/W, respectively. The PEC treatment dramatically reduces the noise equivalent power level and increased the specific detectivity up to a value of 1.43 × 1015 cmHz1/2W-1 Moreover, the noise power density spectra of the ZnO nanorod array photodetectors changed from the dependence of 1/f2 to 1/f. These results demonstrate that the generation-recombination centers are successfully passivated by the PEC oxidation method.
Keywords
1/f noise; II-VI semiconductors; condensation; dangling bonds; gallium compounds; magnesium; nanofabrication; nanorods; oxidation; passivation; photodetectors; photoelectrochemistry; semiconductor growth; surface states; ultraviolet detectors; wide band gap semiconductors; zinc compounds; 1/f2 noise; PEC oxidation method; PEC treatment; ZnO-GaN:Mg; ZnO-based nanorod ultraviolet photodetectors; dangling bonds; generation-recombination centers; high detectivity mechanism; nanorod array photodetectors; noise equivalent power level; noise power density spectra; photoelectrochemical surface passivation; photoresponsivity; surface states; unpassivated nanorod photodetectors; vapor cooling condensation system; voltage -5 V; Density measurement; Light emitting diodes; Nanobioscience; Noise; Photodetectors; Surface treatment; Zinc oxide; Efficiency-gain product; ZnO nanorods; low frequency noise; photoelectrochemical oxidation method; photoresponsivity; specific detectivity;
fLanguage
English
Journal_Title
Photonics Technology Letters, IEEE
Publisher
ieee
ISSN
1041-1135
Type
jour
DOI
10.1109/LPT.2013.2238624
Filename
6412719
Link To Document