Title :
The effects of neutron irradiation on gamma sensitivity of linear integrated circuits
Author :
Gorelick, Jerry L. ; Ladbury, Ray ; Kanchawa, Lina
Author_Institution :
Boeing Satellite Syst., Los Angeles, CA, USA
Abstract :
A dozen linear bipolar microcircuits were first irradiated with neutrons then gammas and compared to the same devices exposed to gammas only. The data show that neutron irradiation can affect subsequent total dose behavior. This has significant hardness assurance implications.
Keywords :
bipolar analogue integrated circuits; dosimetry; neutron effects; radiation hardening (electronics); gamma sensitivity; hardness assurance; linear bipolar microcircuits; linear integrated circuits; neutron irradiation effects; total ionizing dose effects; Analog integrated circuits; Circuit simulation; Circuit testing; Cobalt; Degradation; Inductors; Ionizing radiation; Neutrons; Protons; Satellites;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.839245
