DocumentCode
1189557
Title
The effects of neutron irradiation on gamma sensitivity of linear integrated circuits
Author
Gorelick, Jerry L. ; Ladbury, Ray ; Kanchawa, Lina
Author_Institution
Boeing Satellite Syst., Los Angeles, CA, USA
Volume
51
Issue
6
fYear
2004
Firstpage
3679
Lastpage
3685
Abstract
A dozen linear bipolar microcircuits were first irradiated with neutrons then gammas and compared to the same devices exposed to gammas only. The data show that neutron irradiation can affect subsequent total dose behavior. This has significant hardness assurance implications.
Keywords
bipolar analogue integrated circuits; dosimetry; neutron effects; radiation hardening (electronics); gamma sensitivity; hardness assurance; linear bipolar microcircuits; linear integrated circuits; neutron irradiation effects; total ionizing dose effects; Analog integrated circuits; Circuit simulation; Circuit testing; Cobalt; Degradation; Inductors; Ionizing radiation; Neutrons; Protons; Satellites;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2004.839245
Filename
1369543
Link To Document