DocumentCode
1189683
Title
GMR and magnetodynamics of MnIr spin valves depending on growth order of FM and AFM Layers
Author
Lee, Chan-Gyu ; Gornakov, Vladimir S. ; Koo, Bon-Heon ; Shin, Keesam
Author_Institution
Sch. of Nano & Adv. Mater., Changwon Nat. Univ., South Korea
Volume
41
Issue
10
fYear
2005
Firstpage
2580
Lastpage
2582
Abstract
We have investigated the influence of deposition order of spin-valve (SV) layers on the giant magnetoresistance and magnetic domain structures of top-deposited Si-Ta-Co-Cu-Co-Ir20Mn80-Ta (TSV) and bottom-deposited Si-Ta-Ir20Mn80-Co-Cu-Co-Ta (BSV). The TSV has a maximum MR ratio of about 9.6%, whereas that of the BSV is about 3%. Magnetooptical imaging revealed that the magnetization reversal of both samples occurs by nucleation, extension, and annihilation of microsize domains. It was found that, unlike the TSV, the BSV changes its unidirectional anisotropy in an applied magnetic field. The difference in the domain behavior and in the GMR of the spin valves with top and bottom antiferromagnetic layer deposition could be attributed to differences in defect structures.
Keywords
antiferromagnetic materials; ferromagnetic materials; giant magnetoresistance; magnetic anisotropy; magnetic domains; magnetisation reversal; spin valves; AFM layer; BSV; FM layer; GMR; MnIr spin valves; TSV; antiferromagnetic layer deposition; defect structure; giant magnetoresistance; magnetic domain structure; magnetic field; magnetic layered films; magnetization reversal; magnetodynamics; magnetooptical imaging; microsize domain; Anisotropic magnetoresistance; Antiferromagnetic materials; Giant magnetoresistance; Magnetic anisotropy; Magnetic domains; Magnetic fields; Magnetization reversal; Perpendicular magnetic anisotropy; Spin valves; Through-silicon vias; Giant magnetoresistance (GMR); imaging; magnetic domains; magnetic layered films;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2005.854754
Filename
1519054
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