Title :
Total dose effects in a linear Voltage regulator
Author :
Adell, P.C. ; Schrimpf, R.D. ; Holman, W.T. ; Todd, J.L. ; Caveriviere, S. ; Cizmarik, R.R. ; Galloway, K.F.
Author_Institution :
Radiat. Effects & Reliability Group, Vanderbilt Univ., Nashville, TN, USA
Abstract :
Experiments and simulations are used to analyze the total-dose response of a linear voltage regulator. Degradation of the dynamic output range of the error amplifier is determined to be responsible for the regulator failure. We present a first-order model to reproduce total dose circuit and system response. Modification of the bias circuitry in the error amplifier using beta compensation techniques is shown to harden the system to a significantly higher total dose level.
Keywords :
X-ray effects; dosimetry; operational amplifiers; transient response; voltage regulators; X-ray sources; beta compensation techniques; bias circuitry; degradation; dynamic output range; error amplifier; first-order model; linear voltage regulator; operational amplifier; regulator failure; system response; total dose circuit; total dose effects; transient response; Analytical models; Circuit simulation; Circuits and systems; Degradation; Dynamic range; Feedback loop; Operational amplifiers; Regulators; Resistors; Voltage;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2004.839194
