Total dose effects in a linear Voltage regulator

Author

Adell, P.C. ; Schrimpf, R.D. ; Holman, W.T. ; Todd, J.L. ; Caveriviere, S. ; Cizmarik, R.R. ; Galloway, K.F.

Author_Institution

Radiat. Effects & Reliability Group, Vanderbilt Univ., Nashville, TN, USA

Volume

51

Issue

6

fYear

2004

Firstpage

3816

Lastpage

3821

Abstract

Experiments and simulations are used to analyze the total-dose response of a linear voltage regulator. Degradation of the dynamic output range of the error amplifier is determined to be responsible for the regulator failure. We present a first-order model to reproduce total dose circuit and system response. Modification of the bias circuitry in the error amplifier using beta compensation techniques is shown to harden the system to a significantly higher total dose level.

Keywords

X-ray effects; dosimetry; operational amplifiers; transient response; voltage regulators; X-ray sources; beta compensation techniques; bias circuitry; degradation; dynamic output range; error amplifier; first-order model; linear voltage regulator; operational amplifier; regulator failure; system response; total dose circuit; total dose effects; transient response; Analytical models; Circuit simulation; Circuits and systems; Degradation; Dynamic range; Feedback loop; Operational amplifiers; Regulators; Resistors; Voltage;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2004.839194

Filename

1369564