DocumentCode
1189785
Title
Magnetoresistance in magnetic tunnel junctions with amorphous electrodes
Author
Nakajima, Kentaro ; Feng, Gen ; Coey, J.M.D.
Author_Institution
Phys. Dept., Trinity Coll., Dublin, Ireland
Volume
41
Issue
10
fYear
2005
Firstpage
2609
Lastpage
2611
Abstract
Magnetic tunnel junctions (MTJs) with amorphous CoFeB and Co2MnSi electrodes were fabricated and examined. In the case of [Co90Fe10]100-xBx, the x=32% boron addition reduces the magnetization by 30% compared to Co90Fe10, yet the reduction of the tunnel magnetoresistance (TMR) is over 95%. On the contrary, in the case of Co(100-x-y)MnxSiy, although net magnetization is very small at room temperature, the TMR can be as large as 7%. The character of each metalloid (boron and silicon) could be responsible for the peculiar behavior to each system.
Keywords
amorphous magnetic materials; boron alloys; cobalt alloys; electrodes; iron alloys; magnetisation; manganese alloys; silicon alloys; tunnelling magnetoresistance; Co2MnSi; CoFeB; MTJ; TMR; amorphous electrodes; magnetic tunnel junctions; spin-dependent tunneling; tunnel magnetoresistance; Amorphous materials; Boron; Electrodes; Magnetic films; Magnetic materials; Magnetic tunneling; Magnetization; Plasma temperature; Sputtering; Tunneling magnetoresistance; Amorphous; MTJ; spin-dependent tunneling;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2005.854717
Filename
1519064
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