• DocumentCode
    1189785
  • Title

    Magnetoresistance in magnetic tunnel junctions with amorphous electrodes

  • Author

    Nakajima, Kentaro ; Feng, Gen ; Coey, J.M.D.

  • Author_Institution
    Phys. Dept., Trinity Coll., Dublin, Ireland
  • Volume
    41
  • Issue
    10
  • fYear
    2005
  • Firstpage
    2609
  • Lastpage
    2611
  • Abstract
    Magnetic tunnel junctions (MTJs) with amorphous CoFeB and Co2MnSi electrodes were fabricated and examined. In the case of [Co90Fe10]100-xBx, the x=32% boron addition reduces the magnetization by 30% compared to Co90Fe10, yet the reduction of the tunnel magnetoresistance (TMR) is over 95%. On the contrary, in the case of Co(100-x-y)MnxSiy, although net magnetization is very small at room temperature, the TMR can be as large as 7%. The character of each metalloid (boron and silicon) could be responsible for the peculiar behavior to each system.
  • Keywords
    amorphous magnetic materials; boron alloys; cobalt alloys; electrodes; iron alloys; magnetisation; manganese alloys; silicon alloys; tunnelling magnetoresistance; Co2MnSi; CoFeB; MTJ; TMR; amorphous electrodes; magnetic tunnel junctions; spin-dependent tunneling; tunnel magnetoresistance; Amorphous materials; Boron; Electrodes; Magnetic films; Magnetic materials; Magnetic tunneling; Magnetization; Plasma temperature; Sputtering; Tunneling magnetoresistance; Amorphous; MTJ; spin-dependent tunneling;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2005.854717
  • Filename
    1519064