Title :
Multibit MRAM using a pair of memory cells
Author :
Lim, Chee Kheng ; Kim, Yong Su ; Park, No Yeol ; Lee, Ju
Author_Institution :
Samsung Adv. Inst. of Technol., Suwon, South Korea
Abstract :
Magnetic random access memory (MRAM) is one of the most promising candidates to provide energy-efficient and nonvolatile memory. We present a new MRAM design using a pair of cells where each cell can store two bits of information. The pair cells have a parallelogram shape to induce broken-shape magnetic anisotropy along the short axis of the cell. One important advantage of the pair cells is that they can share the same word- and bit-lines intersection in the MRAM architecture. This means that the number of electrical current lines can be reduced and lead to higher recording density. Such design is successfully demonstrated using finite-element micromagnetic simulation.
Keywords :
finite element analysis; magnetic anisotropy; magnetic storage; random-access storage; shape memory effects; electrical current lines; finite-element micromagnetic simulation; magnetic anisotropy; magnetic random access memory; memory cells; multibit MRAM; nonvolatile memory; shape memory effects; Electric resistance; Energy efficiency; Magnetic anisotropy; Magnetic fields; Magnetic separation; Magnetization; Nonvolatile memory; Perpendicular magnetic anisotropy; Random access memory; Shape; Magnetic random access memory (MRAM); shape memory effects;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2005.855288