DocumentCode
119041
Title
Thermal impedance measurements of layered Metal Core PCB used in LED lighting
Author
Shijuan Zhang ; Wen Xu ; Yongtao Wang ; Wenfeng Wang
Author_Institution
Hubei Collaborative Innovation Center for Adv. Org. Chem. Mater., Hubei Univ., Wuhan, China
fYear
2014
fDate
12-15 Aug. 2014
Firstpage
1419
Lastpage
1422
Abstract
Methods of measuring the thermal impedance of Metal Core PCBs are analyzed. The ASTM D5470 method can measure the thermal conductivity of the insulated layer of MCPCBs, but cannot distinguish the contacting thermal resistance, which introduced during the measuring, and the boundary thermal resistance, arising from the layered structure of MCPCBs. Thus, it cannot measure the whole thermal impedance of MCPCBs, especially when these two thermal resistances are comparable. In principle, ASTM E1461 method is not applicable for measuring heterogeneous materials. Thereafter it should not be used to measure MCPCBs. Using a model based on the theory of heat diffusion across multilayer structure and the data measured by ASTM E1461 method, the whole thermal impedance of MCPCBs can be obtained. This method is quick, convenient and reliable, and there is no contacting with the sample during the measuring.
Keywords
light emitting diodes; lighting; multilayers; printed circuits; thermal conductivity; thermal resistance measurement; ASTM D5470 method; ASTM E1461 method; LED lighting; MCPCB insulated layer; boundary thermal resistance; heterogeneous materials; layered metal core PCB; multilayer structure; thermal conductivity; thermal impedance measurement method; Conductivity; Conductivity measurement; Electrical resistance measurement; Heating; Impedance; Thermal conductivity; Thermal resistance; metal-core PCB; thermal conductivity; thermal impendance;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location
Chengdu
Type
conf
DOI
10.1109/ICEPT.2014.6922921
Filename
6922921
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