DocumentCode
1190432
Title
Magnetic properties of epitaxial Co2Cr1-xFexAl full Heusler alloy thin films with the L21 structure
Author
Hirohata, Astufumi ; Kurebayashi, Hidekazu ; Okamura, Susumu ; Tezuka, Nobuki ; Inomata, Koichiro
Author_Institution
CREST, Japan Sci. & Technol. Agency, Kawaguchi, Japan
Volume
41
Issue
10
fYear
2005
Firstpage
2802
Lastpage
2804
Abstract
Co2Cr1-xFexAl full Heusler alloy thin films (x≥0.4) have been epitaxially grown on GaAs(001) substrates under the optimized condition. Structural analysis reveals the detailed growth mechanism of the films and confirms that the films form the perfectly ordered L21 structure. A magnetization measurement also shows the films possess very strong uniaxial crystalline anisotropy due to the epitaxial growth. By using these films as bottom electrodes of magnetic tunnel junctions, the maximum tunnel magnetoresistance ratio of 8.8% is observed after post-annealing with Al-O insulating barriers for x=1.
Keywords
chromium alloys; cobalt alloys; crystal microstructure; iron alloys; magnetic anisotropy; magnetic epitaxial layers; tunnelling magnetoresistance; Co2CrFeAl; GaAs; L21 structure; annealing; epitaxial growth; full Heusler alloy thin films; growth mechanism; half-metallic ferromagnets; insulating barriers; magnetic properties; magnetic tunnel junctions; magnetization measurement; structural analysis; tunnel magnetoresistance; uniaxial crystalline anisotropy; Aluminum alloys; Chromium alloys; Cobalt alloys; Iron alloys; Magnetic analysis; Magnetic films; Magnetic properties; Magnetization; Substrates; Transistors; Epitaxial growth; full Heusler alloys; half-metallic ferromagnets; tunnel magnetoresistance;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2005.854831
Filename
1519127
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