• DocumentCode
    1190531
  • Title

    Iterative Subspace Analysis Based on Feature Line Distance

  • Author

    Pang, Yanwei ; Yuan, Yuan ; Li, Xuelong

  • Author_Institution
    Sch. of Electron. Inf. Eng., Tianjin Univ., Tianjin
  • Volume
    18
  • Issue
    4
  • fYear
    2009
  • fDate
    4/1/2009 12:00:00 AM
  • Firstpage
    903
  • Lastpage
    907
  • Abstract
    Nearest feature line-based subspace analysis is first proposed in this paper. Compared with conventional methods, the newly proposed one brings better generalization performance and incremental analysis. The projection point and feature line distance are expressed as a function of a subspace, which is obtained by minimizing the mean square feature line distance. Moreover, by adopting stochastic approximation rule to minimize the objective function in a gradient manner, the new method can be performed in an incremental mode, which makes it working well upon future data. Experimental results on the FERET face database and the UCI satellite image database demonstrate the effectiveness.
  • Keywords
    image recognition; iterative methods; mean square error methods; stochastic processes; generalization performance; incremental analysis; iterative subspace analysis; mean square feature line distance; nearest feature line; objective function; projection point; stochastic approximation rule; Face recognition; Image analysis; Image databases; Interpolation; Linear discriminant analysis; Principal component analysis; Scattering; Stochastic processes; Tensile stress; Training data; Face recognition; feature line; subspace;
  • fLanguage
    English
  • Journal_Title
    Image Processing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1057-7149
  • Type

    jour

  • DOI
    10.1109/TIP.2008.2011167
  • Filename
    4799382