DocumentCode :
119064
Title :
Measurement of LED junction temperature using thermoreflectance thermography
Author :
Ling, J.H.L. ; Tay, A.A.O.
Author_Institution :
Temasek Labs., Nanyang Technol. Univ., Nanyang, China
fYear :
2014
fDate :
12-15 Aug. 2014
Firstpage :
1482
Lastpage :
1485
Abstract :
The reliability and optical performance of an LED are dependent on its junction temperature. In this paper, the surface temperature of a chip level conversion LED package was measured using thermoreflectance thermography. The junction-ambient thermal resistance of the same LED device was measured using a thermal transient tester and the junction temperature subsequently calculated from this. Good agreement was obtained between the die surface temperature measured using TRT and the junction calculated from the thermal resistance measured. This work has demonstrated the potentiality of using TRT for directly measuring the junction temperature of LED devices.
Keywords :
electronics packaging; infrared imaging; light emitting diodes; reliability; thermal resistance; thermoreflectance; LED junction temperature measurement; TRT; chip level conversion LED package; die surface temperature; junction-ambient thermal resistance; optical performance; reliability; thermal transient tester; thermoreflectance thermography; Electrical resistance measurement; Electronic packaging thermal management; Junctions; Light emitting diodes; Surface resistance; Temperature measurement; Thermal resistance; LED; Thermal Resistance; Thermoreflectance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
Conference_Location :
Chengdu
Type :
conf
DOI :
10.1109/ICEPT.2014.6922934
Filename :
6922934
Link To Document :
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