• DocumentCode
    119064
  • Title

    Measurement of LED junction temperature using thermoreflectance thermography

  • Author

    Ling, J.H.L. ; Tay, A.A.O.

  • Author_Institution
    Temasek Labs., Nanyang Technol. Univ., Nanyang, China
  • fYear
    2014
  • fDate
    12-15 Aug. 2014
  • Firstpage
    1482
  • Lastpage
    1485
  • Abstract
    The reliability and optical performance of an LED are dependent on its junction temperature. In this paper, the surface temperature of a chip level conversion LED package was measured using thermoreflectance thermography. The junction-ambient thermal resistance of the same LED device was measured using a thermal transient tester and the junction temperature subsequently calculated from this. Good agreement was obtained between the die surface temperature measured using TRT and the junction calculated from the thermal resistance measured. This work has demonstrated the potentiality of using TRT for directly measuring the junction temperature of LED devices.
  • Keywords
    electronics packaging; infrared imaging; light emitting diodes; reliability; thermal resistance; thermoreflectance; LED junction temperature measurement; TRT; chip level conversion LED package; die surface temperature; junction-ambient thermal resistance; optical performance; reliability; thermal transient tester; thermoreflectance thermography; Electrical resistance measurement; Electronic packaging thermal management; Junctions; Light emitting diodes; Surface resistance; Temperature measurement; Thermal resistance; LED; Thermal Resistance; Thermoreflectance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2014 15th International Conference on
  • Conference_Location
    Chengdu
  • Type

    conf

  • DOI
    10.1109/ICEPT.2014.6922934
  • Filename
    6922934