• DocumentCode
    1190836
  • Title

    A study of noise effects due to the diode protection for shield resistance measurement of GMR recording heads

  • Author

    Siritaratiwat, A. ; Tongsomporn, D. ; Chooruang, K. ; Afzulpurkar, N.

  • Author_Institution
    Dept. of Electr. Eng., Khon Kaen Univ., Thailand
  • Volume
    41
  • Issue
    10
  • fYear
    2005
  • Firstpage
    2941
  • Lastpage
    2943
  • Abstract
    This paper examines the noise effects of protection diodes used for preventing voltage breakdown during magnetoresistive (MR)-shield resistance measurement in quasi-static test (QST) for giant magnetoresistive heads (GMR). Two forms of diode protection will be presented and the noise behavior of them will be discussed and compared in the context of the GMR Noise test.
  • Keywords
    diodes; giant magnetoresistance; magnetic heads; magnetic recording noise; magnetoresistive devices; GMR recording heads; diode protection; giant magnetoresistive heads; magnetoresistive-shield resistance measurement; quasistatic test; voltage breakdown prevention; Circuit noise; Circuit testing; Electrical resistance measurement; Giant magnetoresistance; Magnetic heads; Magnetic noise; Noise level; Probes; Protection; Schottky diodes; Diode protection; magnetic noise; magnetoresistive (MR)-shield;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2005.855324
  • Filename
    1519167
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1190836