DocumentCode :
1190937
Title :
Tests and tolerances for high-performance software-implemehted fault detection
Author :
Turmon, Michael ; Granat, Robert ; Katz, Daniel S. ; Lou, John Z.
Author_Institution :
Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA
Volume :
52
Issue :
5
fYear :
2003
fDate :
5/1/2003 12:00:00 AM
Firstpage :
579
Lastpage :
591
Abstract :
We describe and test a software approach to fault detection in common numerical algorithms. Such result checking or algorithm-based fault tolerance (ABFT) methods may be used, for example, to overcome single-event upsets in computational hardware or to detect errors in complex, high-efficiency implementations of the algorithms. Following earlier work, we use checksum methods to validate results returned by a numerical subroutine operating subject to unpredictable errors in data. We consider common matrix and Fourier algorithms which return results satisfying a necessary condition having a linear form; the checksum tests compliance with this condition. We discuss the theory and practice of setting numerical tolerances to separate errors caused by a fault from those inherent in finite-precision floating-point calculations. We concentrate on comprehensively defining and evaluating tests having various accuracy/computational burden tradeoffs, and we emphasize average-case algorithm behavior rather than using worst-case upper, bounds on error.
Keywords :
error analysis; fault tolerant computing; parallel algorithms; roundoff errors; software fault tolerance; Fourier algorithms; algorithm-based fault tolerance methods; checksum methods; checksum tests compliance; common numerical algorithms; high-performance software-implemented fault detection; worst case upper bounds; Algorithms; Application software; Delay; Fault detection; Fault tolerance; Hardware; Single event transient; Single event upset; Software testing; Space technology;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2003.1197125
Filename :
1197125
Link To Document :
بازگشت