Title :
Singularity detection and processing with wavelets
Author :
Mallat, S. ; Hwang, W.L.
Author_Institution :
Courant Inst., New York Univ., NY, USA
fDate :
3/1/1992 12:00:00 AM
Abstract :
The mathematical characterization of singularities with Lipschitz exponents is reviewed. Theorems that estimate local Lipschitz exponents of functions from the evolution across scales of their wavelet transform are reviewed. It is then proven that the local maxima of the wavelet transform modulus detect the locations of irregular structures and provide numerical procedures to compute their Lipschitz exponents. The wavelet transform of singularities with fast oscillations has a particular behavior that is studied separately. The local frequency of such oscillations is measured from the wavelet transform modulus maxima. It has been shown numerically that one- and two-dimensional signals can be reconstructed, with a good approximation, from the local maxima of their wavelet transform modulus. As an application, an algorithm is developed that removes white noises from signals by analyzing the evolution of the wavelet transform maxima across scales. In two dimensions, the wavelet transform maxima indicate the location of edges in images.<>
Keywords :
picture processing; signal processing; transforms; Lipschitz exponents; fast oscillations; image edge location; image processing; irregular structures; modulus maxima; one dimensional signals; signal analysis; signal processing; singularities; two-dimensional signals; wavelet transform; white noise removal; Fourier transforms; Frequency measurement; Mathematics; Noise reduction; Signal analysis; Signal processing; Signal processing algorithms; Wavelet analysis; Wavelet transforms; White noise;
Journal_Title :
Information Theory, IEEE Transactions on