DocumentCode :
1191201
Title :
Degradation testing and lifetime predictions for GMR heads under mechanically and thermally accelerated conditions
Author :
Imamura, Takahiro ; Yamamoto, Kenrou
Author_Institution :
Magnetic Disk Drive Lab., Fujitsu Labs. Ltd., Atsugi, Japan
Volume :
41
Issue :
10
fYear :
2005
Firstpage :
3037
Lastpage :
3039
Abstract :
Testing degradation and predicting the lifetimes of giant magneto-resistive (GMR) heads under mechanically and thermally accelerated conditions are discussed. Our experiments revealed that accumulated mechanical acceleration can cause gradual and continuous head degradation. The amplitude loss was proportional to the integrated acoustic emission (AE) signal, and the amplitude loss rate to the integrated AE was a function of GMR temperature. Lifetime predictions with these parameters are presented.
Keywords :
acceleration; acoustic emission; giant magnetoresistance; life testing; magnetic heads; AE; GMR heads; acoustic emission; amplitude loss; degradation testing; giant magnetoresistive heads; head degradation; lifetime prediction; mechanical acceleration; Acceleration; Coils; Contacts; Electrical resistance measurement; Life estimation; Life testing; Magnetic heads; Magnetic separation; Temperature sensors; Thermal degradation; Acoustic emissions (AEs); degradation; giant magneto-resistive (GMR) heads; lifetime predictions;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2005.855257
Filename :
1519199
Link To Document :
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