Title :
Modelling of electric field and stress in piezoelectric composite plates under bending load
Author :
Beckers, Guillaume ; Dehez, Bruno
Author_Institution :
Centre for Res. in Mechatron. (CEREM), Univ. Catholique de Louvain (UCL), Louvain-La-Neuve, Belgium
Abstract :
Piezoelectric materials have interesting properties for actuator or sensor applications. The direct conversion of electrical to mechanical power is a key property to build lightweight structure. However their small displacement capabilities oblige the designers to put them in amplification structure such as benders. In order to size them at best an accurate model for the stress and electric field is required to use piezoelectric material at its maximum without overcoming the yield stress or the depolarizing electric field. For benders, model based on beam theory usually used failed in evaluating the electric field and the stress. A model considering them as a plate is more suited. In this paper a model which evaluates the variation of the electric field in the layers of piezoelectric laminated plates and takes into account its impact on the stress and the displacement is proposed. A validation based on a 3D finite-element model is performed.
Keywords :
bending; composite materials; finite element analysis; internal stresses; piezoelectric materials; power conversion; yield stress; 3D finite-element model; bending load; depolarizing electric field; electric field modelling; electrical-mechanical power conversion; lightweight structure; model based on beam theory; piezoelectric composite plates; piezoelectric laminated plates; piezoelectric material; piezoelectric materials; small displacement capabilities; stress; stress displacement; yield stress; Electric fields; Equations; Finite element analysis; Mathematical model; Piezoelectric materials; Strain; Stress; benders; design; laminates; plate theory;
Conference_Titel :
Applications of Ferroelectrics, International Workshop on Acoustic Transduction Materials and Devices & Workshop on Piezoresponse Force Microscopy (ISAF/IWATMD/PFM), 2014 Joint IEEE International Symposium on the
Conference_Location :
State College, PA
DOI :
10.1109/ISAF.2014.6922962