Title :
The nonlinear analog fault diagnosis scheme of Wu, Nakajima, Wey, and Saeks in the tableau context
Author :
Flecha, E. ; de Carlo, R.
fDate :
9/1/1984 12:00:00 AM
Keywords :
Analog system fault diagnosis; Nonlinear circuits; Circuit noise; Circuit testing; Digital filters; Electrons; Equations; Fault diagnosis; Integrated circuit interconnections; Signal processing; Sparse matrices; Speech processing;
Journal_Title :
Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCS.1984.1085580
