• DocumentCode
    1191821
  • Title

    Application of Kohonen and supervised forced organisation maps to fault diagnosis in CMOS opamps

  • Author

    Collins, P. ; Yu, Son-Cheol ; Jervis, B.W. ; Bell, I.M. ; Taylor, G.

  • Author_Institution
    Sch. of Eng. Inf. Technol., Sheffield Hallam Univ.
  • Volume
    30
  • Issue
    22
  • fYear
    1994
  • fDate
    10/27/1994 12:00:00 AM
  • Firstpage
    1846
  • Lastpage
    1847
  • Abstract
    Transistors with gate oxide shorts have been identified to 100% fault coverage in a CMOS opamp by monitoring supply current changes first using multilayer perceptrons and then Kohonen maps to resolve any ambiguities. A supervised forced organisation map allows the location and resistance of the short to be determined
  • Keywords
    CMOS integrated circuits; fault location; feedforward neural nets; integrated circuit testing; linear integrated circuits; operational amplifiers; self-organising feature maps; short-circuit currents; CMOS opamps; Kohonen maps; fault diagnosis; gate oxide shorts; multilayer perceptrons; supervised forced organisation maps; supply current; transistors;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19941281
  • Filename
    329979
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1191821