DocumentCode :
119190
Title :
Texture analysis of thick bismuth ferrite lead titanate layers
Author :
Palizdar, Meghdad ; Mallick, D. ; Maity, Tanmoy ; Roy, Sandip ; Comyn, T.P. ; Stevenson, Tim J. ; Fancher, Chris M. ; Jones, Jacob L. ; Poterala, Stephen F. ; Messing, Gary L. ; Suvaci, Ender ; Kleppe, Annette P. ; Jehcoat, Andrew J. ; Bell, Andrew J.
Author_Institution :
Inst. for Mater. Res., Univ. of Leeds, Leeds, UK
fYear :
2014
fDate :
12-16 May 2014
Firstpage :
1
Lastpage :
3
Abstract :
The template grain growth technique was used to synthesis textured 60BiFeO3-PbTiO3(60:40BFPT) by using platelets of BaTiO3 as template. Synchrotron measurement clearly showed textured 60:40BFPT. Moreover, in situ high energy synchrotron radiation was employed to investigate the influence of an external electric filed on crystallographic structure of mixed phase 60:40BFPT. Application of an electric field ≥ 1 kV/mm resulted in phase transformation from mixed rhombohedral/tetragonal phases (≈ 73.5% tetragonal / 26.5% rhombohedral) to predominately tetragonal phase (≈ 95%) at applied field of 6 kV/mm. A crystallographic texture refinement was done by using software package materials analysis using diffraction (MAUD) with a 4th order spherical harmonic orientation distribution function (ODF). This refinement was completed using a P4mm+Cm structure model. Texture coefficients were constrained such that the equivalent texture coefficients of each phase are the same. The resulting texture refinement determined that sample has a 1.3 multiples of random distribution (MRD) {100} crystallographic texture.
Keywords :
bismuth compounds; crystal structure; grain growth; lead compounds; materials preparation; piezoceramics; piezoelectricity; solid-state phase transformations; texture; 4th-order spherical harmonic orientation distribution function; BiFeO3-PbTiO3; MAUD diffraction; P4mm+Cm structure model; crystallographic structure; crystallographic texture refinement; external electric filed; in situ high energy synchrotron radiation; mixed rhombohedral-tetragonal phase transformation; random distribution; software package materials analysis; synchrotron measurement; template grain growth technique; texture analysis; texture coefficients; thick bismuth ferrite lead titanate layers; {100} crystallographic texture; Diffraction; Educational institutions; Electric fields; Magnetometers; Materials; Saturation magnetization; Synchrotrons; Phase transformatio; Refinment; Synchrotron; Texture;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of Ferroelectrics, International Workshop on Acoustic Transduction Materials and Devices & Workshop on Piezoresponse Force Microscopy (ISAF/IWATMD/PFM), 2014 Joint IEEE International Symposium on the
Conference_Location :
State College, PA
Type :
conf
DOI :
10.1109/ISAF.2014.6922999
Filename :
6922999
Link To Document :
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