A precise measurement of QHR at NIM [quantized Hall resistance]

Author

Zhang, Zhonghua ; Wang, Dengan ; Hu, Zhi ; Zhen, Jiu ; He, Qing ; Qiao, Weichuan ; Bliek, L. ; Hein, G. ; Kowalski, W. ; Ebeling, K.J. ; Bruus, H.

Author_Institution

Nat. Inst. of Metrol., Beijing, China

Volume

40

Issue

6

fYear

1991

fDate

12/1/1991 12:00:00 AM

Firstpage

889

Lastpage

892

Abstract

Equipment for precise measurement of the quantized Hall resistance (QHR) at the National Institute of Metrology (NIM), Beijing, China, is described. The essential parts in this equipment are a resistance comparator of one-to-one ratio with a comparison uncertainty of 3×10^-8 and two specially designed resistor networks used for determining of the ratio between 12906.4035 Ω of QHR at i=2 and 10 kΩ or 1 kΩ. The transfer procedure from QHR to 10 kΩ or 1 kΩ can be completed easily with this equipment by a few one-to-one comparisons with a total uncertainty of 5×10^-8

Keywords

electric resistance measurement; measurement standards; quantum Hall effect; 1 kohm; 10 kohm; 12906.4035 ohm; China; GaAs-GaAlAs heterostructure; National Institute of Metrology; quantized Hall resistance; quantum Hall effect; resistance comparator; resistance ratio; resistor networks; Electrical resistance measurement; Hall effect; Helium; Laboratories; Metrology; Potentiometers; Resistors; Switches; Uncertainty; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.119762

Filename

119762