DocumentCode :
1192065
Title :
High responsivity resonant-cavity-enhanced InGaAs/GaAs quantum-dot photodetector for wavelength of ~1 μm at room temperature
Author :
Sun, X.M. ; Zhang, Haijun ; Zhu, Hengliang ; Xu, Peng ; Li, G.R. ; Liu, Jiangchuan ; Zheng, H.Z.
Author_Institution :
State Key Lab. for Microstructures & Superlattices, Chinese Acad. of Sci., Beijing
Volume :
45
Issue :
6
fYear :
2009
Firstpage :
329
Lastpage :
331
Abstract :
The characteristics of a resonant cavity-enhanced InGaAs/GaAs quantum-dot n-i-n photodiode with only a bottom distributed Bragg reflector used as the cavity mirror, are reported. To suppress the dark current, an AlAs layer is inserted into the device structure as the blocking layer. It turns out that the structure still possesses the resonant coupling nature, and makes Rabi splitting discernible in the photoluminescence spectra. The measured responsivity spectrum of the photocurrent shows a peak at lambda = 1030 nm, and increases rapidly as the bias voltage increases. A peak responsivity of 0.75 A/W, or equivalently an external quantum efficiency of 90.3%, is obtained at Vbias= -1.4 V.
Keywords :
III-V semiconductors; gallium arsenide; indium compounds; mirrors; photodetectors; photodiodes; quantum dots; InGaAs-GaAs; bottom distributed Bragg reflector; cavity mirror; dark current; device structure; quantum-dot n-i-n photodiode; resonant cavity enhanced quantum-dot photodetector; temperature 293 K to 298 K; voltage 1.4 V; wavelength 1030 nm;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2009.0033
Filename :
4800396
Link To Document :
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