Analog network testability measurement: a symbolic formulation approach

Author

Carmassi, Roberto ; Catelani, Marcantonio ; Iuculano, Gaetano ; Liberatore, Antonino ; Manetti, Stefano ; Marini, Mauro

Author_Institution

SMA SpA, Florence, Italy

Volume

40

Issue

6

fYear

1991

fDate

12/1/1991 12:00:00 AM

Firstpage

930

Lastpage

935

Abstract

A symbolic formulation approach is applied to the problem of computing testability features of analog linear networks. The program, SAPTES, obtained by following this approach is presented. The program can be a very useful tool for designers and researchers in the field of linear analog circuits. SAPTES, which is written in LISP and runs on MS-DOS personal computers, is able to compute the testability of linear circuits of rather high complexity (composed of tens of components and nodes). Computational times range from a few tens of seconds to some tens of minutes on medium speed computers. The program is easily transportable to workstations or a mainframe, and, for the mainframe, program performance will considerably increase

Keywords

analogue circuits; circuit CAD; circuit analysis computing; linear network analysis; microcomputer applications; CAD; LISP; MS-DOS personal computers; SAPTES; analog linear networks; fault analysis; symbolic analysis; symbolic formulation; testability measurement; transportable program; Circuit faults; Circuit testing; Equations; Fault diagnosis; Helium; Jacobian matrices; Life testing; System testing; Transfer functions; Voltage;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.119770

Filename

119770