• DocumentCode
    1192180
  • Title

    Fabrication of highly [001] oriented L10 FePt thin film using NiTa seed layer

  • Author

    Maeda, Tomoyuki

  • Author_Institution
    Corporate R&D Center, Toshiba Corp., Kawasaki, Japan
  • Volume
    41
  • Issue
    10
  • fYear
    2005
  • Firstpage
    3331
  • Lastpage
    3333
  • Abstract
    A highly [001] oriented L10 FePt thin film has been successfully fabricated on glass disk substrates by using Ni-Ta alloy seed layer with O2 exposure process. The [001] orientation of Fe-Pt was improved by exposing Ni-Ta surface to O2 ambient in the deposition process of Ni-Ta/Cr/Pt/Fe-Pt film. An excess O2 exposure degrades the coercivity because of the suppression of the ordering of FePt. Under the optimum O2 exposure condition, perpendicular coercivity of as large as 6.9 kOe was achieved with good squareness and little remanence in the in-plane magnetization curve for the film stack of Ni-Ta (5 nm)/Cr (5 nm)/Pt (10 nm)/Fe-Pt (10 nm)/C (7 nm) structure. The total thickness of the underlayers is as thin as 20 nm.
  • Keywords
    coercive force; ferromagnetic materials; iron alloys; magnetic anisotropy; magnetic thin films; metallic thin films; nickel alloys; platinum alloys; remanence; sputtered coatings; substrates; tantalum alloys; 20 nm; NiTa seed layer; NiTa-Cr-Pt-FePt; coercivity; glass disk substrates; highly oriented thin film; magnetization curve; remanence; Chromium; Coercive force; Fabrication; Glass; Infrared heating; Magnetic films; Magnetic materials; Perpendicular magnetic recording; Substrates; Transistors; (001) orientation; FePt; Ni–Ta; O; high anisotropy material; order parameter; perpendicular magnetic recording media; seed layer;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2005.855203
  • Filename
    1519296