DocumentCode
1192211
Title
A bit-serial architecture for digital signal processing
Author
Kanopoulos, Nikos
Volume
32
Issue
3
fYear
1985
fDate
3/1/1985 12:00:00 AM
Firstpage
289
Lastpage
291
Abstract
This paper describes the architecture of a bit-serial VLSI circuit designed for digital signal processing applications. This circuit is capable of performing matrix-vector multiplications in a totally pipeline fashion. Although this circuit naturally performs multiplication of a
matrix with a 3-element vector at a time, it can perform a (matrix)
(vector) operation of any size. Under different control modes, the same architecture can also perform vector addition and scalar multiplication of vectors of arbitrary length. The circuit has been designed for a single chip implementation using 4
-NMOS technology. The word size of the chip is 16 bits, and the data is provided in 2\´s complement form. The chip contains approximately 6000 transistors in an area of 5.7
and operates with a 6-MHz two-phase clock in direct interface with a 6-MHz microprocessor. It can also be interfaced with a programmable digital signal processor. The chip is housed in a 64-pin DIP. A self-testing scheme incorporated into the design allows fault detection and isolation in a particular unit (storage or arithmetic unit) during the data processing.
matrix with a 3-element vector at a time, it can perform a (matrix)
(vector) operation of any size. Under different control modes, the same architecture can also perform vector addition and scalar multiplication of vectors of arbitrary length. The circuit has been designed for a single chip implementation using 4
-NMOS technology. The word size of the chip is 16 bits, and the data is provided in 2\´s complement form. The chip contains approximately 6000 transistors in an area of 5.7
and operates with a 6-MHz two-phase clock in direct interface with a 6-MHz microprocessor. It can also be interfaced with a programmable digital signal processor. The chip is housed in a 64-pin DIP. A self-testing scheme incorporated into the design allows fault detection and isolation in a particular unit (storage or arithmetic unit) during the data processing.Keywords
Signal processing; VLSI; Very large-scale integration (VLSI); Built-in self-test; Circuits; Clocks; Digital signal processing; Digital signal processors; Electronics packaging; Microprocessors; Pipelines; Signal design; Very large scale integration;
fLanguage
English
Journal_Title
Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0098-4094
Type
jour
DOI
10.1109/TCS.1985.1085686
Filename
1085686
Link To Document