DocumentCode
1192275
Title
Low programming voltage floating gate analogue memory cells in standard VLSI CMOS technology
Author
Durfee, D.A. ; Shoucair, F.S.
Author_Institution
Brown Univ., Providence, RI, USA
Volume
28
Issue
10
fYear
1992
fDate
5/7/1992 12:00:00 AM
Firstpage
925
Lastpage
927
Abstract
Floating gate MOSFET structures were fabricated in a standard 2 mu m double-polysilicon CMOS process which requires programming voltages of only 6.5-9 V. This considerable reduction in programming voltage is achieved by simultaneously exploiting tunnelling through the interpolysilicon oxide and capacitive geometries whose top poly-layers overlap the edges of the lower poly-layers.
Keywords
CMOS integrated circuits; VLSI; analogue storage; 2 micron; 6.5 to 9 V; VLSI CMOS technology; analogue memory cells; capacitive geometries; double-polysilicon CMOS process; floating gate; interpolysilicon oxide; programming voltages; tunnelling;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19920586
Filename
137193
Link To Document