• DocumentCode
    1192275
  • Title

    Low programming voltage floating gate analogue memory cells in standard VLSI CMOS technology

  • Author

    Durfee, D.A. ; Shoucair, F.S.

  • Author_Institution
    Brown Univ., Providence, RI, USA
  • Volume
    28
  • Issue
    10
  • fYear
    1992
  • fDate
    5/7/1992 12:00:00 AM
  • Firstpage
    925
  • Lastpage
    927
  • Abstract
    Floating gate MOSFET structures were fabricated in a standard 2 mu m double-polysilicon CMOS process which requires programming voltages of only 6.5-9 V. This considerable reduction in programming voltage is achieved by simultaneously exploiting tunnelling through the interpolysilicon oxide and capacitive geometries whose top poly-layers overlap the edges of the lower poly-layers.
  • Keywords
    CMOS integrated circuits; VLSI; analogue storage; 2 micron; 6.5 to 9 V; VLSI CMOS technology; analogue memory cells; capacitive geometries; double-polysilicon CMOS process; floating gate; interpolysilicon oxide; programming voltages; tunnelling;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19920586
  • Filename
    137193