DocumentCode :
1192711
Title :
Cryogenic Microwave Cavity for Semiconductor Diagnostics
Author :
Brodwin, Morris E. ; Lu, Pao-Sun
Volume :
18
Issue :
3
fYear :
1969
Firstpage :
208
Lastpage :
210
Abstract :
A replaceable wall microwave cavity for semiconductor diagnostics is described for operation at cryogenic temperatures. A method of temperature compensation of resonant frequency is developed to minimize the frequency deviation due to thermal contraction of the cavity body. The anomalous skin effect at low temperatures is observed and taken into consideration.
Keywords :
Copper; Cryogenics; Magnetic field measurement; Resonant frequency; Skin effect; Tail; Temperature; Thermal conductivity; Thermal expansion; Wire;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1969.4313802
Filename :
4313802
Link To Document :
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