DocumentCode
1192711
Title
Cryogenic Microwave Cavity for Semiconductor Diagnostics
Author
Brodwin, Morris E. ; Lu, Pao-Sun
Volume
18
Issue
3
fYear
1969
Firstpage
208
Lastpage
210
Abstract
A replaceable wall microwave cavity for semiconductor diagnostics is described for operation at cryogenic temperatures. A method of temperature compensation of resonant frequency is developed to minimize the frequency deviation due to thermal contraction of the cavity body. The anomalous skin effect at low temperatures is observed and taken into consideration.
Keywords
Copper; Cryogenics; Magnetic field measurement; Resonant frequency; Skin effect; Tail; Temperature; Thermal conductivity; Thermal expansion; Wire;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.1969.4313802
Filename
4313802
Link To Document