• DocumentCode
    1192804
  • Title

    Damping at normal metal/permalloy interfaces

  • Author

    Rantschler, James O. ; Maranville, B.B. ; Mallett, Jonathan J. ; Chen, Peijei ; McMichael, Robert D. ; Egelhoff, William F., Jr.

  • Author_Institution
    Magnetic Mater. Group, Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • Volume
    41
  • Issue
    10
  • fYear
    2005
  • Firstpage
    3523
  • Lastpage
    3525
  • Abstract
    We have determined the Gilbert damping parameter as a function of layer thickness in six sets of samples with either a normal metal (NM)/Permalloy (NiFe) or NM/NiFe/NM structure by measuring the ferromagnetic resonance (FMR) linewidth for all series and correcting for extrinsic broadening effects. In the NM/NiFe samples, we find that increasing the interface roughness increases the damping quadratically from 0.01 at 3 nm to 0.11 at 47 nm, and by controlling the roughness of the copper layer, we have found there is no evidence of increased damping due to the thickness of the copper layer between 100-2050 nm of copper.
  • Keywords
    Permalloy; ferromagnetic materials; ferromagnetic resonance; interface phenomena; magnetic multilayers; 100 to 2050 nm; Cu; Gilbert damping parameter; NiFe; ferromagnetic resonance measurement; interface phenomena; interface roughness; layer thickness; metal/permalloy interfaces; Copper; Damping; Magnetic anisotropy; Magnetic devices; Magnetic films; Magnetic resonance; Magnetic separation; Perpendicular magnetic anisotropy; Rough surfaces; Thickness measurement; Interface phenomena; lossy systems; magnetic resonance; permalloy;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2005.854956
  • Filename
    1519360