Title :
Damping at normal metal/permalloy interfaces
Author :
Rantschler, James O. ; Maranville, B.B. ; Mallett, Jonathan J. ; Chen, Peijei ; McMichael, Robert D. ; Egelhoff, William F., Jr.
Author_Institution :
Magnetic Mater. Group, Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We have determined the Gilbert damping parameter as a function of layer thickness in six sets of samples with either a normal metal (NM)/Permalloy (NiFe) or NM/NiFe/NM structure by measuring the ferromagnetic resonance (FMR) linewidth for all series and correcting for extrinsic broadening effects. In the NM/NiFe samples, we find that increasing the interface roughness increases the damping quadratically from 0.01 at 3 nm to 0.11 at 47 nm, and by controlling the roughness of the copper layer, we have found there is no evidence of increased damping due to the thickness of the copper layer between 100-2050 nm of copper.
Keywords :
Permalloy; ferromagnetic materials; ferromagnetic resonance; interface phenomena; magnetic multilayers; 100 to 2050 nm; Cu; Gilbert damping parameter; NiFe; ferromagnetic resonance measurement; interface phenomena; interface roughness; layer thickness; metal/permalloy interfaces; Copper; Damping; Magnetic anisotropy; Magnetic devices; Magnetic films; Magnetic resonance; Magnetic separation; Perpendicular magnetic anisotropy; Rough surfaces; Thickness measurement; Interface phenomena; lossy systems; magnetic resonance; permalloy;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2005.854956