DocumentCode :
1193072
Title :
Domain structure of magnetically micro-patterned PtMn/NiFe exchange bias bilayers
Author :
Potzger, K. ; Bischoff, L. ; Liedke, M.O. ; Hillebrands, B. ; Rickart, M. ; Freitas, P.P. ; McCord, J. ; Fassbender, J.
Author_Institution :
Forschungszentrum Rossendorf, Dresden, Germany
Volume :
41
Issue :
10
fYear :
2005
Firstpage :
3610
Lastpage :
3612
Abstract :
A PtMn/NiFe exchange bias system with an exchange bias field of 180 Oe was magnetically patterned by means of a low fluence focused ion beam. A 1 μm wide stripe pattern with the long axis (1000 μm) oriented parallel to the exchange bias field direction has been irradiated by 2×1014 Ga+/cm2. In the irradiated area the coercivity is reduced and the exchange bias field vanishes, while in the nominally nonirradiated region between the irradiated stripes the exchange bias field is reduced to approximately 35 Oe. This reduction is attributed to the magnetic coupling of the irradiated stripes to their intervening nonirradiated regions. Magnetic domain imaging by means of Kerr microscopy and magnetic force microscopy support this interpretation.
Keywords :
coercive force; focused ion beam technology; iron alloys; magnetic domains; magnetic multilayers; manganese alloys; nickel alloys; platinum alloys; PtMn-NiFe; coercivity; domain structure; exchange bias bilayers; focused ion beam technology; magnetic coupling; magnetic domain imaging; magnetic force anisotropy; magnetic patterning; patterned magnetic layers; Amorphous magnetic materials; Magnetic anisotropy; Magnetic domains; Magnetic films; Magnetic force microscopy; Magnetic materials; Magnetic properties; Magnetosphere; Perpendicular magnetic anisotropy; Soft magnetic materials; Exchange bias; Kerr microscopy; focused ion beam; magnetic domains; magnetic force microscopy; patterned magnetic layers;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.2005.854785
Filename :
1519386
Link To Document :
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