• DocumentCode
    1193326
  • Title

    High-Impulse Current and Voltage Measurement

  • Author

    Thomas, Robert J.

  • Volume
    19
  • Issue
    2
  • fYear
    1970
  • fDate
    5/1/1970 12:00:00 AM
  • Firstpage
    102
  • Lastpage
    117
  • Abstract
    This paper is a survey of methods of high-impulse current and voltage measurement. Typically, such measurement techniques must now include capabilities for measuring high-energy impulses having peak powers as high as many megawatts, currents as high as many mega-amperes, or voltages as high as several megavolts, with rise times as short as a fraction of a microsecond (even as short as the subnanosecond range for moderately high-energy impulses). These capabilities had to be attained in recent years to meet the needs of various areas of scientific research employing such high-energy impulses. This represents a significant extension in the state of the art of such measurement techniques beyond their more traditional role in development and testing of high-voltage bulk power system equipment. The three most commonly used methods of high-impulse current measurement are the magnetic probe, current transformer, and "pure" resistive shunt methods. These methods are treated in considerable detail. High-voltage capacitive dividers, resistive dividers, and reflection-type attenuators are covered as the principal methods of high-impulse voltage measurement, with some added discussion of the means of insulating such devices. A brief description is given of schemes involving use of laser light sources to measure high-impulse currents and voltages by means of magnetooptic and electrooptic effects. Diagnosis of the complete properties of high-power pulses is also discussed. The emphasis throughout the paper is on a review directed toward practical measurement considerations and techniques.
  • Keywords
    Attenuators; Current measurement; Current transformers; Lasers and electrooptics; Measurement techniques; Power system measurements; Power transformer insulation; Probes; System testing; Voltage measurement;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.1970.4313872
  • Filename
    4313872