Applications of high-resolution MFM system with low-moment probe in a vacuum

Author

Yamaoka, T. ; Watanabe, K. ; Shirakawabe, Y. ; Chinone, K. ; Saitoh, E. ; Tanaka, M. ; Miyajima, H.

Author_Institution

SII NanoTechnol. Inc., Chiba, Japan

Volume

41

Issue

10

fYear

2005

Firstpage

3733

Lastpage

3735

Abstract

Magnetic force microscopy (MFM) is very useful for observing magnetic domain structures. However, due to stray fields from an MFM probe, observations of small magnetic domain structures are limited. The authors have developed a high-resolution MFM system that utilizes a low-moment probe and a quality (Q)-controlled prove driver, which allows high-quality measurement in a vacuum without disturbing domain structures. Using this system, a resolution finer than 20 nm was achieved. In this paper, the advantages of this MFM are demonstrated using a Permalloy honeycomb nanonetwork and a Permalloy semicircular loop.

Keywords

magnetic domains; magnetic force microscopy; magnetic variables measurement; MFM probe; high-resolution MFM system; low-moment probe; magnetic domain structures; magnetic force microscopy; magnetic variables measurement; Magnetic devices; Magnetic domains; Magnetic force microscopy; Magnetic forces; Nanoscale devices; Nanotechnology; Probes; Q factor; Springs; Vacuum systems; Magnetic domains; Q factor; magnetic force microscopy;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2005.854926

Filename

1519427