DocumentCode :
1194301
Title :
The Development of a Narrow-Band Time-Domain Reflectometer
Author :
Ogletree, S.T. ; Makios, V.
Volume :
21
Issue :
2
fYear :
1972
fDate :
5/1/1972 12:00:00 AM
Firstpage :
161
Lastpage :
166
Abstract :
The capability of accurately determining the value of impedance discontinuities in transmission line systems is obtained by replacing the dc pulse with a gated RF source in a conventional time-domain reflectometer (TDR) system. Such a system allows complex impedance measurements to be made upon elements in a system that are physically inaccessible. Due to the sensitivity available in TDR systems, low orders of magnitude of return losses are easily detectable and measurable. In systems where multiple impedance discontinuities exist, each individual discontinuity may be isolated and hence analyzed separately. The modifications to a conventional TDR system are described in this paper. A method of using the modified narrow-band TDR system to measure complex impedance is presented. This method is complementary to that used by the Hewlett-Packard model 1580A narrow-band TDR and offers the avantages of both phase information and lower modulation frequency.
Keywords :
Frequency measurement; Frequency modulation; Impedance measurement; Loss measurement; Narrowband; Phase modulation; Reflectometry; Time domain analysis; Transmission line discontinuities; Transmission line measurements;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1972.4313987
Filename :
4313987
Link To Document :
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