• DocumentCode
    1194328
  • Title

    Capacity planning under demand uncertainty for semiconductor manufacturing

  • Author

    Hood, Sarah Jean ; Bermon, Stuart ; Barahona, Francisco

  • Author_Institution
    IBM Microelectron. Div., Hopewell Junction, NY, USA
  • Volume
    16
  • Issue
    2
  • fYear
    2003
  • fDate
    5/1/2003 12:00:00 AM
  • Firstpage
    273
  • Lastpage
    280
  • Abstract
    In the semiconductor industry, capacity planning, the calculation of number of tools needed to manufacture forecasted product demands, is difficult because of sensitivity to product mix and uncertainty in future demand. Planning for a single demand profile can result in a large gap between planned capacity and actual capability when the realized product mix turns out differently from the one planned. This paper presents a method which accepts this uncertainty and uses stochastic integer programming to find a tool set robust to changes in demand. It considers a set of possible, discrete demand scenarios with associated probabilities, and determines the tools to purchase, under a budget constraint, to minimize weighted average unmet demand. The resulting robust tool set deals well with all the scenarios at no or minimal additional cost compared to that for a single demand profile. We also discuss the modifications of conventional business processes, needed to implement this method for dealing explicitly with uncertainty in demand.
  • Keywords
    assembly planning; integer programming; integrated circuit manufacture; production control; stochastic programming; uncertainty handling; actual capability; budget constraint; capacity planning; demand uncertainty; discrete demand scenarios; forecasted product demands; planned capacity; robust tool set; semiconductor manufacturing; single demand profile; stochastic integer programming; weighted average unmet demand; Capacity planning; Demand forecasting; Discrete event simulation; Linear programming; Production; Robustness; Semiconductor device manufacture; Stochastic processes; Throughput; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Semiconductor Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0894-6507
  • Type

    jour

  • DOI
    10.1109/TSM.2003.811894
  • Filename
    1198040