Title :
Transimpedance preamplifier with 70-dB AGC range in fine-line NMOS
Author :
Jindal, Renuka P.
Author_Institution :
AT&T Bell Labs., Murray Hill, NJ, USA
fDate :
6/1/1988 12:00:00 AM
Abstract :
The test results for an NMOS transimpedance preamplifier with 50-Ω drive capability and built-in automatic gain control (AGC) function are presented. Measurements at 0.88 Gb/s using λ=1.3 μm and a p-i-n photodiode yield an average output power of -26 dBm with bit error rate (BER)=10-9. A method to estimate the receiver sensitivity from noise-figure measurements is also proposed. This provides a relatively simple complementary technique to optical bit error rate (BER) measurements
Keywords :
automatic gain control; digital communication systems; field effect integrated circuits; linear integrated circuits; optical communication equipment; preamplifiers; receivers; repeaters; sensitivity; 0.88 Gbit/s; 1.3 micron; AGC; PIN photodetector; automatic gain control; bit error rate; digital transmission; fine-line NMOS; monolithic IC; noise-figure measurements; optical communication equipment; p-i-n photodiode; receiver sensitivity; repeaters; transimpedance preamplifier; Automatic testing; Bit error rate; Gain control; MOS devices; Optical noise; Optical receivers; PIN photodiodes; Power generation; Power measurement; Preamplifiers;
Journal_Title :
Solid-State Circuits, IEEE Journal of
