Transimpedance preamplifier with 70-dB AGC range in fine-line NMOS

Author

Jindal, Renuka P.

Author_Institution

AT&T Bell Labs., Murray Hill, NJ, USA

Volume

23

Issue

3

fYear

1988

fDate

6/1/1988 12:00:00 AM

Firstpage

867

Lastpage

869

Abstract

The test results for an NMOS transimpedance preamplifier with 50-Ω drive capability and built-in automatic gain control (AGC) function are presented. Measurements at 0.88 Gb/s using λ=1.3 μm and a p-i-n photodiode yield an average output power of -26 dBm with bit error rate (BER)=10^-9. A method to estimate the receiver sensitivity from noise-figure measurements is also proposed. This provides a relatively simple complementary technique to optical bit error rate (BER) measurements

Keywords

automatic gain control; digital communication systems; field effect integrated circuits; linear integrated circuits; optical communication equipment; preamplifiers; receivers; repeaters; sensitivity; 0.88 Gbit/s; 1.3 micron; AGC; PIN photodetector; automatic gain control; bit error rate; digital transmission; fine-line NMOS; monolithic IC; noise-figure measurements; optical communication equipment; p-i-n photodiode; receiver sensitivity; repeaters; transimpedance preamplifier; Automatic testing; Bit error rate; Gain control; MOS devices; Optical noise; Optical receivers; PIN photodiodes; Power generation; Power measurement; Preamplifiers;

fLanguage

English

Journal_Title

Solid-State Circuits, IEEE Journal of

Publisher

ieee

ISSN

0018-9200

Type

jour

DOI

10.1109/4.331

Filename

331