• DocumentCode
    1194636
  • Title

    An assessment of wide bandgap semiconductors for power devices

  • Author

    Hudgins, Jerry L. ; Simin, Grigory S. ; Santi, Enrico ; Khan, M.Asif

  • Author_Institution
    Dept. of Electr. Eng., Univ. of South Carolina, Columbia, SC, USA
  • Volume
    18
  • Issue
    3
  • fYear
    2003
  • fDate
    5/1/2003 12:00:00 AM
  • Firstpage
    907
  • Lastpage
    914
  • Abstract
    An advantage for some wide bandgap materials, that is often overlooked, is that the thermal coefficient of expansion (CTE) is better matched to the ceramics in use for packaging technology. It is shown that the optimal choice for uni-polar devices is clearly GaN. It is further shown that the future optimal choice for bipolar devices is C (diamond) owing to the large bandgap, high thermal conductivity, and large electron and hole mobilities. A new expression relating the critical electric field for breakdown in abrupt junctions to the material bandgap energy is derived and is further used to derive new expressions for specific on-resistance in power semiconductor devices. These new expressions are compared to the previous literature and the efficacy of specific power devices, such as heterojunction MOSFETs, using GaN are discussed.
  • Keywords
    III-V semiconductors; carrier mobility; diamond; electric breakdown; electric resistance; energy gap; gallium compounds; p-n heterojunctions; power MOSFET; power semiconductor devices; silicon compounds; thermal expansion; wide band gap semiconductors; C; GaN; SiC; abrupt junctions; breakdown; ceramics; critical electric field; diamond; electron mobilities; heterojunction MOSFET; high thermal conductivity; hole mobilities; large bandgap; material bandgap energy; on-resistance; packaging technology; power devices; power semiconductor devices; specific power devices; thermal coefficient of expansion; uni-polar devices; wide bandgap semiconductors; Ceramics; Charge carrier processes; Electron mobility; Gallium nitride; Photonic band gap; Semiconductor device packaging; Semiconductor materials; Thermal conductivity; Thermal expansion; Wide band gap semiconductors;
  • fLanguage
    English
  • Journal_Title
    Power Electronics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8993
  • Type

    jour

  • DOI
    10.1109/TPEL.2003.810840
  • Filename
    1198071