DocumentCode
1194979
Title
Development of Y-Shaped Filtered-Arc-Deposition System for Preparing Multielement Composition-Controlled Film
Author
Tanoue, Hideto ; Hikosaka, Hiroki ; Mashiki, Takayuki ; Oke, Shinichiro ; Suda, Yoshiyuki ; Takikawa, Hirofumi ; Hasegawa, Yushi ; Taki, Makoto ; Kamiya, Masao ; Ishikawa, Takeshi ; Yasui, Haruyuki
Author_Institution
Dept. of Electr. & Electron. Eng., Toyohashi Univ. of Technol., Toyohashi
Volume
37
Issue
7
fYear
2009
fDate
7/1/2009 12:00:00 AM
Firstpage
1140
Lastpage
1145
Abstract
In recent years, multielement films have been required for high-performance cutting tools. In this paper, a Y-shaped filtered-arc-deposition (Y-FAD) system with two vacuum-arc sources was developed. First, an optimum magnetic coil arrangement was experimentally established to transport two plasma beams through the Y-shaped duct at the same time. Since the two plasma beams have the same electrical polarity, they naturally tend to repel each other. Therefore, in the second step, the two plasma beams were combined into one plasma beam through a mixer part by vibrating the plasma beams with a laterally oscillating magnetic field. Third, the electrical bias applied to the duct was optimized to obtain a higher transportation rate of plasma and deposition rate. After these design developments and tuning, titanium-aluminum (Ti-Al) film with a combined deposition pattern was finally obtained with Al and Ti cathodes. The controllability of the composition ratio by the arc current was verified.
Keywords
aluminium alloys; metallic thin films; plasma deposition; plasma sources; plasma transport processes; titanium alloys; vacuum arcs; TiAl; Y-shaped filtered-arc-deposition; cathodes; cutting tools; electrical bias; electrical polarity; magnetic coil arrangement; multielement composition-controlled film; oscillating magnetic field; plasma beam transport; vacuum-arc sources; Current ratio; Y-shaped filtered arc deposition (Y-FAD); duct bias; multielement film; titanium–aluminum (Ti–Al) film;
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2009.2014765
Filename
4801720
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