DocumentCode :
1195108
Title :
The Characterization and Measurement of Nonlinearities in Transient Measuring Systems
Author :
Blair, Jerome J.
Volume :
21
Issue :
4
fYear :
1972
Firstpage :
500
Lastpage :
504
Abstract :
We show here that a wide class of nonlinearities in systems for measuring transients can be characterized as a delay that depends on the value and derivative of the signal being measured near the point at which it is being measured. Methods of measuring the delay as a function of these parameters are given.
Keywords :
Delay effects; Delay systems; Distortion measurement; Integral equations; Linear systems; Nonlinear systems; Sampling methods; Taylor series; Time invariant systems; Time measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/TIM.1972.4314075
Filename :
4314075
Link To Document :
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