Title :
Measurement and analysis for stripline material parameters using network analyzers
Author :
Davis, William A. ; Bunting, Charles F. ; Bucca, Steven E.
Author_Institution :
Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Uni., Blacksburg, VA, USA
fDate :
4/1/1992 12:00:00 AM
Abstract :
The characterization of material parameters for dielectrics used in the construction of stripline and related structures is presented. The measured scattering parameters of transmission-line samples are used to predict the characteristics of the dielectric materials used in the construction in addition to effects due to rough dielectric-conductor interfaces. The measurements have been performed using a network analyzer with the `thru-reflect-line´ calibration technique. The calibration process, the structure of the transmission-line sample, and the frequency-domain model are reviewed. Measured results are presented with predicted values for the dielectric constant and loss tangent of dielectric materials common in thick-film structures
Keywords :
dielectric materials; dielectric measurement; network analysers; strip lines; thick films; Ag; AgPd; Au; dielectric constant; dielectric materials; dielectric-conductor interfaces; frequency-domain model; loss tangent; network analyzers; scattering parameters; stripline material; surface roughness; thick-film structures; thru reflect line; transmission-line; Building materials; Calibration; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Performance analysis; Performance evaluation; Scattering parameters; Stripline; Transmission lines;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
