Measurement and analysis for stripline material parameters using network analyzers

Author

Davis, William A. ; Bunting, Charles F. ; Bucca, Steven E.

Author_Institution

Bradley Dept. of Electr. Eng., Virginia Polytech. Inst. & State Uni., Blacksburg, VA, USA

Volume

41

Issue

2

fYear

1992

fDate

4/1/1992 12:00:00 AM

Firstpage

286

Lastpage

290

Abstract

The characterization of material parameters for dielectrics used in the construction of stripline and related structures is presented. The measured scattering parameters of transmission-line samples are used to predict the characteristics of the dielectric materials used in the construction in addition to effects due to rough dielectric-conductor interfaces. The measurements have been performed using a network analyzer with the `thru-reflect-line´ calibration technique. The calibration process, the structure of the transmission-line sample, and the frequency-domain model are reviewed. Measured results are presented with predicted values for the dielectric constant and loss tangent of dielectric materials common in thick-film structures

Keywords

dielectric materials; dielectric measurement; network analysers; strip lines; thick films; Ag; AgPd; Au; dielectric constant; dielectric materials; dielectric-conductor interfaces; frequency-domain model; loss tangent; network analyzers; scattering parameters; stripline material; surface roughness; thick-film structures; thru reflect line; transmission-line; Building materials; Calibration; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Performance analysis; Performance evaluation; Scattering parameters; Stripline; Transmission lines;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.137362

Filename

137362